Ключевые слова: HTS, YBCO, coated conductors, fabrication, PLD process, RABITS process, doping effect, pinning centers artificial, microstructure, density, grain alignment, measurement technique, Hall sensor, critical caracteristics, Jc/B curves, local distribution, critical current density, experimental results
Ключевые слова: HTS, YBCO, doping effect, coated conductors, IBAD process, RABITS process, template layers, films, substrate SrTiO3, PLD process, comparison, microstructure, electron diffraction, distribution, X-ray diffraction, lattice parameter, magnetization, temperature dependence, critical current density, distribution, experimental results
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Malagoli A., Ferdeghini C., Mancini A., Vannozzi A., Celentano G., Braccini V., Putti M., Manfrinetti P., Pallecchi I., Bernini C., Bellingeri E., Leveratto A., Sylva G., Lisitskiy M., Manca N., Provino A.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Ключевые слова: HTS, REBCO, coated conductors, mechanical properties, tensile tests, strain effects, GdBCO, RCE-CDR process, MOCVD process, MOD process, substrate Hastelloy, substrate Ni-W, substrate stainless steel, IBAD process, RABITS process, comparison, transverse stress, critical caracteristics, critical current, n-value, recovery characteristics, degradation studies, stabilizing layers, brass laminate, experimental results, electromechanical analysis
Ferdeghini C., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Bellingeri E., Sylva G.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, RABITS process, template layers, fabrication, substrate Ni-W, X-ray diffraction, PLD process, microstructure, buffer layers, texture, resistivity, temperature dependence, magnetic field dependence, upper critical fields, irreversibility fields, critical caracteristics, Jc/B curves, pinning force
Eisterer M., Schultz L., Huhne R., Tendeloo G.V., Pahlke P., Lao M., Meledin A., Sieger M., Nielsch K.
Ключевые слова: HTS, YBCO, coated conductors, fabrication, phase composition, pinning, PLD process, RABITS process, substrate Ni-W, IBAD process, substrate stainless steel, comparison, doping effect, X-ray diffraction, critical caracteristics, lattice parameter, critical current density, critical temperature, thickness dependence, microstructure, critical current, critical current density, experimental results
Ключевые слова: HTS, REBCO, coated conductors, comparison, fusion magnets, YBCO, GdBCO, PLD process, IBAD process, RABITS process, MOCVD process, RCE-CDR process, MOD process, substrate Hastelloy, substrate stainless steel, substrate Ni-W, critical caracteristics, critical current density, magnetic field dependence, pinning force, temperature dependence, irreversibility fields, relaxation, transport currents, angular dependence, neutron irradiation, irradiation effects
Ключевые слова: HTS, YBCO, YDyBCO, coated conductors, stacking fault, critical caracteristics, critical current, TFA-MOD process, substrate Ni-W, RABITS process, X-ray diffraction, microstructure, porosity, lattice parameter, oxygenation treatments, phase composition, nanoparticles, angular dependence, pinning, fabrication, experimental results
Ключевые слова: HTS, coated conductors, grain boundaries, PLD process, substrate Ni-W, YBCO, RABITS process, magnetic field distribution, critical caracteristics, angular dependence, transport currents, magnetic field dependence, IBAD process, chemical solution deposition, comparison, microstructure
Holzapfel B., Yamaguchi T., Iida K., Takeya H., Takano Y., Tanaka M., Fujioka M., Demura S., Okazaki H., Yamashita A., Denholme S.J., Sakata H.
Ключевые слова: chalcogenide, FeSe, RABITS process, tapes, electrochemical process, fabrication, critical temperature, susceptibility
Ключевые слова: HTS, coated conductors, seed layers, texture, fabrication, RABITS process, substrate Ni-W
Ключевые слова: HTS, coated conductors, YBCO, GdBCO, YGdBCO, microstructure, phase composition, pinning, comparison, commercialization, MOD process, MOCVD process, PLD process, RCE-LATS process, IBAD process, RABITS process, X-ray diffraction, critical caracteristics, Jc/B curves, anisotropy, pinning force, experimental results
Hanisch J., Schultz L., Huhne R., Usoskin A., Pahlke P., Sieger M., Stromer J., Chekhonin P., Skrotzki W.
Ключевые слова: HTS, YBCO, films, PLD process, RABITS process, substrate Ni-W, IBAD process, stainless steel, buffer layers, microstructure, measurement technique
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.